LOW TEMPERATURE DIELECTRIC BEHAVIOR IN PB(Zr1-xTix)O3 FERROELECTRIC CERAMICS
Abstract
Temperature dielectric behavior in oxidized and non-oxidized PZT (60/40) and PZT (40/60) ceramics were analyzed in a frequency and temperature range of 1 kHz-10 MHz and from 15 to 400 K, respectively. The results revealed an anomalous dielectric behavior at temperatures closed to 250 K inoxidized and non-oxidized PZT samples. Temperature polarization behavior in pyro-electric measurement
shows monotony changed in the same temperature range. Dipolar behavior could be the cause of detected
anomaly.
Keywords: perovskite structure, temperature dielectric behavior, oxidation, reduction, PZT.
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Published
2015-11-05
How to Cite
Pérez-Delfin, M. E., Vega-García, L. A., Leyet, D. Y., Guerrero, D. F., & Eiras, D. J. A. (2015). LOW TEMPERATURE DIELECTRIC BEHAVIOR IN PB(Zr1-xTix)O3 FERROELECTRIC CERAMICS. Revista Cubana De Química, 24(2), 121–125. Retrieved from https://cubanaquimica.uo.edu.cu/index.php/cq/article/view/323
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